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China Communications  2017, Vol. 14 Issue (8): 10-21    DOI:
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LDPC Coding Scheme for Improving the Reliability of Multi-Level-Cell NAND Flash Memory in Radiation Environments
Guangjun Ge1,2, Liuguo Yin1,2,*
1 School of Aerospace, Tsinghua University, Beijing 100084, China;
2 EDA Laboratory, Research Institute of Tsinghua University in Shenzhen, Shenzhen 518057, China
 
 
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